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TTCN-3 User Conference 2009

3  - 5 June 2009, ETSI, Sophia Antipolis, France

 

Spreading the TTCN-3 Success
 a

 

Wednesday 3rd June 2009
Registration open: 09:00 - 09:30
Tutorial Tracks
09:30 - 12:45

TTCN-3 Basics

 

Introduction to TTCN-3

Theofanis Vassiliou-Gioles
(Testing Technologies)

 

Advanced TTCN-3

 

Strategies for database testing using TTCN-3

Bernard Stepien (University of Ottawa)

 

12:45 - 14:00
Lunch
14:00 - 15:30

TTCN-3 Basics

 

Implementation and Execution of TTCN-3 – the TRI and TCI Interfaces
Theofanis Vassiliou-Gioles
(Testing Technologies)

 

 

Advanced TTCN-3

Quality Assurance for TTCN-3 Test Specifications
Benjamin Zeiss, Jens Grabowski, Philip Makedonski (University of Göttingen),
Andreas Ulrich ( Siemens AG)

 

15:30-15:45 Coffee Break
15:45 - 17:15 TTCN-3 Basics

How to implement TTCN-3 codecs and adapters efficiently
Anthony Baire, César Viho (IRISA)

Advanced TTCN-3

TTCN-3 and its role and usage in MBT from the D-MINT perspective
Thomas Bauer, (Fraunhofer IESE)
Axel Rennoch (Fraunhofer FOKUS)

 

 
Thursday 4th June  2009
Registration open: 8:30 - 9:00
9:00 - 9:30

Conference Opening Session:

Dieter Hogrefe (TC MTS chairman)

Mike Sharpe (ETSI VP Standards Development)

Anthony Wiles (ETSI CTI Director)

Ina Schieferdecker (T3UC2009 PC chair)

Emmanuelle Chaulot-Talmon (T3UC2009 OC chair)

9:30 - 10:15 Keynote Speech: Autosar conformance testing using TTCN-3
Alain Gilberg, Mathieu Morvan (Autosar Consortium )

Introduced by: Ina Schieferdecker (Fraunhofer FOKUS)
10:15 - 10:45
Coffee Break




10:45 - 11:15


11:15 - 11:45


11:45 - 12:15


12:15 - 12:45

SESSION  I:    Conformance and Interoperability Testing

Chair: Anthony Wiles (ETSI)

 

A TTCN-3 test automation framework for HL7/IHE based applications

Ina Schieferdecker, Diana Vega, George Din (Technische Universität Berlin)

 

LTE test suites for UE conformance

Hellen Griffiths, Wolfgang Seka, Shicheng Hu (ETSI)

 

Mapping AUTOSAR interfaces to TTCN-3

Jürgen Großmann, Ina Schieferdecker (Fraunhofer FOKUS)

 

Using TTCN-3 to control the WIMAX interoperability testbed

Francois Fischer (FSCOM), Peter Kremer (ETSI)

 

12:45 - 14:00
Lunch
14:00 - 14:45 Keynote Speech: Establishing TTCN-3 in a System Development Process
Andrej Pietschker (Giesecke & Devrient GmbH)

Introduced by: Andreas Ulrich (Siemens Corporate Technology)
14:45 - 15:15 Coffee Break
 



15:15 - 15:45



15:45 - 16:15



16:15 - 16:45


16:45 - 17:15

SESSION II:    Test Engineering

Chair: Gyorgy Rethy (Ericsson)

 

Log once, debug anywhere: a portable deterministic approach to record-replay test case execution

Pavel Yakovenko (Russian Academy of Sciences)

 

New TTCN-3 Test Adapter Framework with Capability Description

Ji Wu, Bo Yang, Luo Xu (Beihang University)

 

Offshore Delivery of TTCN-3 Testing Services

Miguel Ramos (Métodos y Tecnología)

 

Module Testing with TTCN-3: Does it pay off?

Joachim H Fröhlich (Siemens AG)
17:15 - 17:30
Coffee Break
16:00 -18:00
TTCN-3 Certificate Exam
17:30 - 18:15 Vendor Tracks
 18:15 - 18:30

Best
Technical & Business
Presentation Award

18:30 Bus departure for the Social Event

 

 
Friday 5th June
9:00 - 9:30

Announcements:

T3UC Asia 2009, TTCN-3 Forum Asia

 

9:30 - 10:15 Keynote Speech: Seeding Bugs to Find Bugs: Mutation Testing Revisited
Andreas Zeller (Saarland University
)

Introduced by: Cesar Viho (IRISA)
10:15 - 10:45
Coffee Break




10:45 - 11:05



11:05 - 11:25


11:25 - 11:45


11:45 - 12:05




12:05 - 12:25


12:25 - 12:45

SESSION III:   Test Research & Standardization

Chair: Dieter Hogrefe (University of Göttingen)

 

The new TTCN-3 version 4.1.1

Thomas Deiss (NSN), Jens Grabowski (University of Göttingen), Gyorgy Rethy (Ericsson), Ina Schieferdecker (Fraunhofer FOKUS)

 

Experiences from the first ETSI TTCN-3 Tool Plugtest

Stephan Schulz (ETSI)

 

Automated interoperability testing with TTCN-3

Theofanis Vassiliou-Gioles (Testing Technologies), Stephan Schulz (ETSI)

 

Model Centric Testing: Challenges and Solutions in Test Design, Test Management and Test Execution

Georg Götz and Armin Metzger, sepp.med gmbh

 

Model based TTCN-3 testing – experiences from industrial case studies

Andrus Lehtmets, Andres Kull, Kullo Raiend (Elvior)

 

Smart Communications for Intelligent Transportation Systems (SCTS) - Approach for Testing

Dr. Hans-Joachim Fischer (ESF GmbH)

12:45 - 14:00
Lunch
14:00 - 14:45 Keynote Speech: Research In Motion’s First Look at TTCN-3
Sean Cavanagh (RIM)  

Introduced by: Bernard Stepien (University of Ottawa)
14:45 - 15:15 Coffee Break




15:15 - 15:45




15:45 - 16:15


16:15 - 16:45


16:45 - 17:15

SESSION IV:   Distributed Systems

Chair: Stephan Schulz (ETSI)

 

Testing Embedded Systems in the Automotive Industry with TTCN-3

Friedrich-Wilhelm Schröer (Fraunhofer FIRST), Jens Grobowski (University of Göttingen), Jürgen Großmann (Fraunhofer FOKUS), Jacob Wieland (Testing Technologies), Diana Serbanescu (Technische Universität Berlin)

 

Scenario Care Load Testing in TTCN-3

Ji Wu, Bo Yang, Luo Xu  (Beihang University)

 

Integration Testing of Large Distributed Systems

Andreas Ulrich (Siemens Corporate Technology)

 

Testing Access Control tools

Bernard Stepien, Amy Felty, Stan Matwin (University of Ottawa)

 

17:15 - 17:45
Conference Closure